Abstract
A review of the basic theory on thermally stimulated luminescence (TSL) and conductivity (TSC) based on a certain simple model is given. Approximate analytical expressions for the shapes of the TSL and TSC curves are derived. Methods from the literature for trap depth determination, some of which can easily be derived from these expressions, are applied to numerically calculated TSL and TSC curves. It turns out that the methods of Bube, Haering and Adams, Hoogenstraaten and Unger yield a correct value for the trap depth independent of the values of the retrapping ratio and the frequency factor. The method of Garlick and Gibson is reliable if applied below 15% of the maximum TSL intensity. Some methods, as most of those derived by Chen, yield a correct trap depth for a specific value of the retrapping ratio in the case of TSL only.
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