Abstract
We examined the number of layers in graphene using Raman microscopy and investigated the interlayer interactions by understanding the layer stacking through the E∗(low) mode measured in Raman spectroscopy designed for low-frequency observation. The number of layers in Raman image was determined from the G/2D intensity ratio, and the interlayer stacking for 2, 3 and 4 layers was understood from the positions of the E∗(low) mode. While most part of sample showed AB stacking, a small area showed random stacking of layers. Low-frequency Raman spectroscopy revealed that such sample area was consisted of weakly interacted random stacking of graphene layers.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
