Abstract
The effective emissivity of cavities or interreflecting surfaces is formulated in terms of the effective absorptivity using Kirchhoff s law and the reciprocity of the bidirectional reflectivity distribution function. It is shown that, according to the formulation, the effective emissivity can be evaluated by analyzing absorption processes of radiation. Several types of reference sources are evaluated statistically and analytically: cylindro-cones, lateral holes formed on a sample tube, and opaque samples covered by a hemispherical mirror. The radiative properties of the associated surfaces are characterized by the isotropic specular-diffuse model.
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