Abstract
The merits of different modulated molecular beam detection systems are discussed and the application of modern data handling methods described. It is shown that by using time domain analysis together with fourier transform techniques, information on the kinetics of surface processes is obtained. Data at a number of excitation frequencies is obtained in a single experiment. A means of detecting non-linear surface processes, and an accurate method for the determination of reaction orders is given. The origin of spurious coherent signals is considered, and finally the application of the techniques is illustrated with data obtained from an investigation of the interaction of modulated As4 beams with GaAs surfaces.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
