Abstract
This paper deals with the evaluation of statistical methods for assessing product reliability from degradation data. The evaluation is based on a simulation study. Benefits of assessing reliability from degradation data over censored failure time data are demonstrated using data from the first simulation run. Bias, precision and coverage probability calculated from the 105 simulated samples are the performance measures used in the evaluation. Analysis of a real gallium arsenide (GaAs) laser data set for telecommunication systems emphasizes the practical advantages of assessing reliability from degradation data.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
