Abstract
Boron delta-doped multilayers are potential reference materials for the evaluation of depth resolution in secondary ion mass spectrometry (SIMS). In this work, we studied extraction of depth resolution parameters using a theoretical model, mixing–roughness-information (MRI) depth model from the measured profiles under various O 2 + bombardment conditions. Specimens used were boron delta-doped multilayers in Si (period: 3–20 nm) which had been made by magnetron-sputtering deposition. For SIMS, information depth can be regarded to be very small, so we used only the two parameters concerning mixing and roughness. Measured B profiles were fitted well to the MRI model. The depth resolution parameters could be extracted even from a profile of multilayers with a short periodicity. The combination of short-period multilayers and MRI model analysis would be useful for evaluation of depth resolution in shallow depth profiling.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.