Abstract
ABSTRACT Relaxor ferroelectric (1−x)Pb(Zn1/3Nb2/3)O3-xPbTiO3(PZNT) crystals were grown from PZNT-PbO high temperature solution by flux Bridgman, bottom seeded solution growth (BSSG) and gas-cooling methods. PZNT wafers cutting from flux Bridgman and BSSG-grown crystals were homogenous while serious inclusions were observed in PZNT wafers grown by the gas-cooling method. The < 001 > -oriented PZNT crystals exhibited nearly the same dielectric/piezoelectric properties whatever the growth methods. However, the mechanical properties, such as Vickers' Microhardness Hv and fracture toughness Kc of the crystal grown by gas-cooling method were much inferior. It was suggested that BSSG method is a potential approach for growing large-size and high-quality PZNT crystals.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
