Abstract
The performance of a home-made tomographic system for film-based rotational X-ray tomography is evaluated by comparison of calculated intensity profiles to measured film density profiles within tomograms of aluminium test objects with small implemented defects. The calculated intensity profiles have been obtained using the back-projection and summation method, calculating the linear absorption coefficient by integrating over the entire energy spectrum of the applied microfocus X-ray set. It is shown that the logarithmic response of the X-ray film must be taken into account when relating intensity profiles to film-density units. The resulting calculated film density profiles nicely fits the actually measured profiles, indicating a low total unsharpness. It is concluded that the method is capable of resolving voids down to about 25 µm. However, due to the inherent blurring of the method, image processing techniques must be applied.
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