Evaluation of parasitic coupling among coupled microstrip line discontinuities using a multiport network modeling approach

Abstract

This paper presents a convenient method for evaluating parasitic coupling caused by coupled microstrip line discontinuities. A Multiport Network Model and a Planar Lumped Model are used to evaluate voltage distributions around the discontinuity edges and along the coupled line section. This voltage distribution is expressed as an equivalent magnetic current distribution which is used to compute the terms of the mutual coupling matrix [Ym] representing the Mutual Coupling Network, MCN. The multiport network modeling approach for evaluation of parasitic coupling among single and coupled microstrip discontinuities is presented in this paper. Results of parasitic coupling caused by coupled microstrip line discontinuities are given in this paper.