Abstract
Assessing the instrumental resolution of confocal Raman microscopy is a key aspect in 2D or 3D imaging in various applications. An important issue in this regard is the experimental measurement of a lateral resolution for the Raman microscope system. Several methods have been proposed for the resolution measurement in fluorescence microscopy; however, these methods have rather limited applications. In this paper, we demonstrate an experimental approach for evaluating the lateral resolution with well‐defined nano‐patterns in confocal Raman microscopy and discuss the factors that can improve estimation of instrumental resolution. This study contributes to the further understanding of the assessment of instrumental resolution in confocal scanning Raman microscopy.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
