Abstract
Abstract : High pressure spark gaps have been used in a pulse charged mode for many single pulse and low pulse repetition rate modulators and other pulsed power devices. High power, high pulse repetition rate modulators require that spark gaps or other switches recover over a period that is less than the interpulse time. The recovery rate can be greatly enhanced by actively purging the spark gap. [1,2] This paper addresses some of the issues that must be dealt with in developing purged spark gaps for high average power, extremely high peak power pulsed devices.
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