Abstract
A method based on the spectral response of polycrystalline semiconductor photovoltaic cells for evaluation of the grain boundary recombination velocity (S GB ) is presented. The wavelength of the maximum of the spectral response, for a polycrystalline semiconductor with known grain size, depends on S GB . By comparison of the experimental with the theoretical wavelength of the maximum of the spectral response, it is possible to determine the grain boundary recombination velocity.
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