Evaluation of fullerenes C60/C70 layers in polystyrene thin films by neutron and X-ray reflectometry

Abstract

Thin films of polystyrene-fullerene C60 and C70 nanocomposites are investigated by X-ray, neutron reflectometry and AFM. These films were prepared by spin coating from toluene solutions with fullerene content of 1, 3, and 5 wt % relative to polystyrene mass. The concomitant to spin-coating formation of aggregates, larger for C70, was observed. Still, a formation of an enriched layer of fullerenes with a thickness up to 5 nm was detected after model fitting of the reflectivity curves.