Abstract
Magnetic bilayer films with an interface of α-Fe(100) and Nd2Fe14B(001) planes were fabricated in order to evaluate the exchange-coupling constant, which was recently reported to depend on the Miller indices of the interface planes. The epitaxial growth of both α-Fe and Nd2Fe14B layers was confirmed with the epitaxial relation of MgO(100)[100] || α-Fe(100)[110] || Nd2Fe14B(001) [110], according to the X-ray pole-figure measurements. FMR experiments on this film were performed by using a Q-band microwave apparatus. We observed a significant shift of α-Fe resonance field from Hr = 5.24 kOe to Hr = 4.41 kOe in a bilayer film sputtered at TSNFB = 650°C compared to a reference film without an Nd2Fe14B layer. This lower shift suggests the existence of an internal field due to the positive exchange coupling between α-Fe and Nd2Fe14B phases. The magnitude of the exchange-coupling constant was estimated to be in the range between 6.5 and 11 erg/cm2 for the bilayer film sputtered at TSNFB = 650°C.
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