Abstract
The paper deals with the eddy current testing by means of a technique based on local field excitation, with the objective to enhance sensitivity and spatial resolution of flaw detection. Two modifications of innovative eddy current probes are presented. Results of the application of the probes for an examination of thin Inconel plate specimens with small artificial defects on the opposite surface are compared. The criteria for comparison are signal-to-noise ratios and spatial resolution of the responses obtained. Performance of the probes is analyzed on the basis of the study of the distribution of their excitation fields with application of magneto-optic sensors and finite element modeling. The decrease of the local extent of the excitation field has been found to be the main cause of sensitivity decrease of the probes to detect opposite-surface defects.
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