Abstract
A /sup 140/La tracer has been used to identify the sources of cross-contamination when conventional high-performance liquid chromatography was used to collect metal ion fractions for subsequent analysis by ..cap alpha.. spectrometry or mass spectrometry. Major sources of memory effects identified were normal band broadening, sorption onto metal surfaces, and retention within sample valves; secondary sorption effects within the column and isotopic exchange with sorbed metal ions were not important sources of memory effects. On the basis of these results a recommended procedure was developed that gives cross-contamination levels of less than or equal to 0.006%. Sample preparation techniques for the ..cap alpha.. spectrometric and mass spectrometric analyses of the collected fractions are discussed, and some examples are given of applications to analytical problems in geochemistry and the nuclear industry. Good sample recoveries were obtained for the sample range studied (0.1-500 ng).
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