Abstract
This paper presents conducted emission measurements for a group of commercially available capacitive step-up dc/dc converters. A comparison of the traditional line impedance stabilization network conducted emission method with integrated circuit test methods including $1\,\Omega$ , direct and transverse electromagnetic cell methods is presented. The frequency performance and systematic offsets of each method are examined. Relative electromagnetic compatibility of these devices is compared and correlation of results of different methods explored. Improved understanding of the electromagnetic environment improves the potential reliability of electronic systems.
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