Abstract

In general, the mechanical properties of hard thin coatings are investigated using indentation methods. Material characteristics of hard coatings, such as elastic modulus and hardness, are evaluated by means of nanoindentation and an appropriate evaluation methodology. The most popular method used to obtain the coating properties required using nanoindentation is the evaluation based on the Oliver and Pharr methodology. Adhesion and wear properties can be calculated using these data. In this study, we used a novel method to evaluate the wear and adhesion of coatings. A special measuring device combined with static indentation and acoustic emission signal detection was developed to evaluate the adhesion of coatings. The device consists of a macrohardness instrumental indentation device equipped with an acoustic emission measuring gauge. It was used to investigate crack formation and adhesion of coatings deposited on different substrates using acoustic emissions data. The results using both the existing and novel methods were compared and evaluated.

Highlights

  • The quality of coated mechanical components mainly depends on the quality of the coating–substrate system

  • The most important parameter influencing the coating lifetime under load is the quality of the bonding or adhesion between the substrate and coating

  • The adhesion of coatings to substrates is one of the most important parameters used for thin layer quality evaluation

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Summary

Introduction

The quality of coated mechanical components mainly depends on the quality of the coating–substrate system. The functions of the mechanical components can be significantly impaired. This is important for deposited coatings used to increase the mechanical resistance of machine tools. The most important parameter influencing the coating lifetime under load is the quality of the bonding or adhesion between the substrate and coating. Adhesion is defined as a state when two surfaces are bonded together by an inter-layer [1]. The adhesion of coatings to substrates is one of the most important parameters used for thin layer quality evaluation

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