Abstract
This paper presents a power density/efficiency evaluation in single phase power factor correction (PFC) applications operating in continuous conduction mode (CCM). The comparison is based on semiconductor dynamic characterization and a mathematical model for prediction of the conducted electromagnetic interference (EMI). The dynamic characterization is based on a low inductive double pulse tester (DPT). The measured switching energy is used in order to evaluate the devices performance in a conventional PFC. This data is used together with the mathematical model for prediction of the conducted electromagnetic interference. The method allows comparing different devices and evaluating the performance as a function of the PFC power density and efficiency.
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