Evaluating Scattered Electromagnetic Field from Fractal Surface Using its Components

Abstract

In this paper, a novel method is proposed to evaluate the scattered field from rough surfaces by decomposition-reconstitution. The extended boundary condition method (EBCM) is employed in conjunction with a Weierstrass Mandelbrot (WM) function for fractal surface profile and its components. WM function can be decomposed into a series of sinusoidal profile. The properties of the sinusoidal profile and WM function to be periodic and almost periodic allow the deriving respective amplitudes of the scattered Floquet modes. The superposition of scattered fields from each sinusoidal component is consistent with the scattered field from WM surface. The result has compared with AIEM in backscattering coefficients. Thus, by calculating the scattered information for each sinusoidal component of the rough surface, we can obtain the overall scattered field.