Abstract
ESD (electrostatic discharge) protection design for RF ICs is a challenging design problem, for which one critical aspect is to properly characterize RF ESD protection designs. This paper presents an overview of RF ESD protection structure evaluation techniques including ESD zapping test, TLP (transmission line pulse) test and S-parameter measurement. Characterization results of typical ESD protection structures are discussed, based on which suitable RF ESD protection structures are suggested.
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