Abstract
The rectifying front contact of Si surface barrier detectors is usually an evaporated Au film. The properties of this contact may not be optimal in three respects: (a) stability against changing ambient conditions, (b) window thickness and (c) current injection properties. Results are presented of measurements made on PtSi front contacts, as an alternative. We find that while the leakage currents (including the temperature dependence) and ultimate resolution are comparable with typical AunSi results, the PtSiSi system is less sensitive to touching, and changing ambient conditions, and has possibilities for small window thickness. It is suggested that in some applications, the PtSi front contact can be a viable alternative to Au, for nuclear radiation detectors, as well as light detectors.
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