Abstract

Test data collection is increasingly seen as an important functionality of the ATE. The lack of clear specification parameters makes comparison of different ATE equipment with regard to data collection a difficult job. In this paper, the approach of Infineon Technologies is presented. Evaluation scenarios for measuring the performance of new ATE equipment regarding diagnosis data acquisition during production test are described. Evaluation results of state-of-the-art test equipment are compared and the deficiencies of today's test equipment are discussed compared to Infineons requirement zero run time overhead

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