Abstract
AbstractUnderstanding of fundamental processes as well as nanostructure performance of nano‐engineered systems, novel materials, and quantum architectures, often requires advanced imaging and spectroscopic tools. This is particularly critical as dimensions shrink below 100 nm as visible light cannot directly probe function at these lengthscales. Ultrafast extreme ultraviolet (EUV) techniques offer a pathway to both functional characterization and imaging at sub‐50 nm lengthscales, and a host of use cases in materials and nano science have been demonstrated. Progress in terms of source and instrumentation development are assisting the rapid increase in the availability of these approaches in the laboratory.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
