Abstract
PurposeThe purpose of this paper is to investigate the structure and electrical properties of eutectic Sb7.4Te92.6 as made thin films to evaluate their potentiality for application to non-volatile phase-change memories.Design/methodology/approachThe films were prepared by the pulsed laser deposition technique. The films were characterized by using X-ray diffraction in grazing-incident geometry, differential scanning calorimetry, Raman spectroscopy and transversal current–voltage curves.FindingsThe memory effect state, characteristic of a typical phase-change memory material, was observed. The temperature of crystallization was about 100ºC.Research limitations/implicationsFurther studies on endurance, scaling and SET/RESET operations are needed.Practical implicationsOne of the main characteristic values, the hold voltage and the threshold voltage values, were about 0.85 and 1.2 V, respectively, in a line with those of Ge2Sb2Te5, GeTe and Sb2Te being considered to date as the main compounds for phase-change memory devices.Originality/valueThe conduction mechanism in the amorphous regime is highly agreed with the Poole–Frenkel effect in deep traps.
Sign-in/Register to access full text options 
Free) 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a call
