Abstract
We report on the sol–gel fabrication, using a dip-coating technique, of low-loss Eu-doped 70SiO2 – HfO2–xZnO (x = 2, 5, 7 and 10 mol%) ternary glass-ceramic planar waveguides. Transmission electron microscopy and grazing incident x-ray diffraction experiments confirm the controlled growth of hybrid nanocrystals with an average size of 3 nm–25 nm, composed of ZnO encapsulated by a thin layer of nanocrystalline HfO2, with an increase of ZnO concentration from x = 2 mol% to 10 mol% in the SiO2–HfO2 composite matrix. The effect of crystallization on the local environment of Eu ions, doped in the ZnO–HfO2 hybrid nanocrystal-embedded glass-ceramic matrix, is studied using photoluminescence spectra, wherein an intense mixed-valence state (divalent as well as trivalent) emission of Eu ions is observed. The existence of Eu2+ and Eu3+ in the SiO2–HfO2–ZnO ternary matrix is confirmed by x-ray photoelectron spectroscopy. Importantly, the Eu-doped ternary waveguides exhibit low propagation losses (0.3 ± 0.2 dB cm–1 at 632.8 nm) and optical transparency in the visible region of the electromagnetic spectrum, which makes ZnO–HfO2 nanocrystal-embedded SiO2–HfO2–ZnO waveguides a viable candidate for the development of on-chip, active, integrated optical devices.
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