Abstract
Abstract Hippuric acid (HA) crystals were grown by conventional slow evaporation method and were doped with urea and thiourea. The solvent used was acetone. The obtained crystals were subjected to single crystal XRD studies using ENRAF NONIUS CAD4-F single crystal X-ray diffractometer with MoKα (λ = 0.7107 A) radiation. The Second harmonic studies reveal that the crystals have appreciable conversion efficiency. The etching studies were carried using Ethanol, methanol and acetone as etchants. The observations indicate that the deformation is minimum. The mechanical hardness were determined and it showed that the crystals are stable for device applications.
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