Abstract

Diffuse ultrasonic backscatter measurements can explain the phenomenon of the scattering at interfaces in heterogeneous materials. The theoretical models of diffuse ultrasonic backscatter for longitudinal (L-L) and shear (T-T) wave scattering within polycrystalline materials have recently been developed. A mean correlation length of metals is successfully calculated from the L-L model at normal incidence in a pulse-echo inspection. Above the first critical angle, mode-conversion scattering occurs when the longitudinal waves are converted to shear waves (L-T) at material grain boundaries. With a similar formalism, a mode-conversion scattering (L-T) model is presented to describe this process. The model is then to fit the experimental response for a pitch-catch transducer configuration and the correlation length is extracted by modifying the beam function. The mean correlation length from the L-T model is in agreement with both the L-L model and the results obtained from optical micrographs. This presentation outlines the theoretical framework and the method to extract the mean correlation length. Mode-converted backscatter removes the influence of the front-wall reflection and may lead to improvements in microstructural characterization and material property evaluation. [Research supported by FRA.]

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