Abstract
Mercury cadmium telluride (HgCdTe) is one of the most commonly used material systems for infrared detection. The performance of infrared focal-plane arrays (IRFPAs) based on this material is limited by several noise sources. In this paper, we focus on the fixed pattern noise, which is related to disparities between the spectral responses of pixels. In our previous work, we showed that spectral nonuniformities in a HgCdTe IRFPA were caused by inhomogeneities of thickness and cadmium composition in the HgCdTe layer, using an optical description of the pixel structure. We propose to use this bidimensional dependence combined with experimental spectral responses to estimate disparities of thickness and cadmium composition in a specific HgCdTe-based IRFPA. The estimation methods and the resulting maps are presented, highlighting the accuracy of this nondestructive method.
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