Abstract
To design optoelectronic functionalities in nanometer scale based on interactions of electronic system with optical near-fields, it is essential to evaluate the relationship between optical near-fields and their sources. Several theoretical studies have been performed, so far, to analyze such complex relationship to design the interaction fields of several specific scales. In this study, we have performed detailed and high-precision measurements of optical near-field structures woven by a large number of independent polarizations generated in the gold nanorods array under laser light irradiation at the resonant frequency. We have accumulated the multi-layered data of optical near-field imaging at different heights above the planar surface with the resolution of several nm by a STM-assisted scanning near-field optical microscope. Based on these data, we have performed an inverse calculation to estimate the position, direction, and strength of the local polarization buried under the flat surface of the sample. As a result of the inverse operation, we have confirmed that the complexities in the nanometer scale optical near-fields could be reconstructed by combinations of induced polarization in each gold nanorod. We have demonstrated the hierarchical properties of optical near-fields based on spatial frequency expansion and superposition of dipole fields to provide insightful information for applications such for secure multi-layered information storage.
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