Abstract
In present study, electrostatic force microscopy (EFM) is used to estimate the intrinsic work function of few layer graphene (FLG) transferred on SiO2 (300nm)/Si (500μm) substrate. This FLG has been prepared by using the mechanical exfoliation technique. In exfoliated FLG, adhesive residues are always left from scotch tape on its surface. These residues as well as SiO2 substrate could modify the work function due to the formation of dipoles on the surface. Taking the effect of adhesive into account, FLG is pre-charged and then scanned with a tip biased with dc voltage. Intrinsic work function of FLG is determined and found to be 4.52±0.1eV.
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