Abstract
The paper describes a method of estimating the elastic constants, mass density and thickness of a thin film fabricated on a substrate. The method is substantially based on fitting simplified theoretical SAW velocity dispersion to experimental dispersion data by non-linear least squares. The result has shown that when the film thickness is large, or when the film thickness or the longitudinal wave velocity is known, other material constants can be estimated without much difficulty.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
