Estimation of current distribution within conductors by field measurements

Abstract

In this paper, data of external magnetic field measured near the conductor surfaces are used in order to estimate the current distribution in conductors. The inverse eddy current problem is formulated. Recently, the sampled pattern matching (SPM) method was developed as a powerful tool to solving inverse source and identification problems. Here, the same technique is extended to the inverse eddy current problems through defining the governing equations for eddy current problem, and using appropriate fundamental Green functions. The current distribution problem is reduced to a position searching problem of the current sources in conducting regions from field distributions obtained by measurements. The thin film transformer is investigated. Previously, this transformer has been analyzed using integral equations. Magnetic field distribution around the surfaces of the conductors is measured and used as an input data to SPM method. The cross sections of the conductors are considered. The conducting region is considered as composed of source and eddy current carrying regions. The current distribution within thin film conductors has been estimated at different mode and conditions of the film transformer