Abstract
AbstractIntensity distributions of the diffracted X rays on a polycrystalline surface were investigated as a function of incidence angles for the surface. In the previous study, we derived the intensity of X‐ray propagation in surface layer materials characterized by a complex refractive index that changes continuously with depth. Using that result, we now analyzed the method for evaluating the distribution of crystal grain size in the surface layer by using X‐ray diffraction at small glancing angles of incidence. The dependence of the peak width of diffracted X‐rays on the incidence angle lead to the depth profile of the crystal grain size in the surface layer. Using the calculation to reproduce the experimental result, the depth profile of the crystal grain size in the surface polycrystalline layers was evaluated. The evaluated result shows that the crystal grain under the mechanically polished iron surface is very small. Copyright © 2006 John Wiley & Sons, Ltd.
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