Estimation of constant failure rates of electronic components at reduced voltage stresses

Abstract

In space-borne systems, the reliability of an electronic component is increased by derating, i.e. operating the component at a temperature or voltage stress below its normal capacity. The improvement in reliability due to derating can be estimated if the failure rate at derated stress is known. This paper shows a method of evaluating the failure rates of some electronic components at various stress ratios when the normal failure rate is known.