Abstract
Various types of censoring schemes basically type-I and type-II censoring schemes and their modified versions are used in life testing experiments. Most of the tests used in life testing experiments are based on a single sample. A joint censoring scheme is quite useful in conducting comparative life tests of products from different units within the same facility. In this article, we consider two exponential life time models under joint multiply type-II censoring scheme, which is a generalization of usual type-II censoring scheme, implemented on the two samples. We have considered maximum likelihood estimation and Bayesian estimation for estimating the reliability of the product under such a censoring scheme. The results are compared with the results obtained under usual type-II censoring scheme. In Bayes estimation the effect of prior parameters on mean life time and reliability of the product is discussed. We have used the local influence approach for identifying observations that strike a disproportionate effect in the maximum likelihood estimate of the reliability in the model. The life time data set of air-conditioning systems of two Boeing 720 jet airplanes “7914” and “7913” are used to apply the theory developed in the paper.
Highlights
Different censoring schemes are available in the literature to optimize time, cost and efficiency of the life testing experiment
In type-II censoring scheme, the test termination time is random and it may takes more than the expectation of the experimenter, which increases the cost of the experiment
We have developed a maximum likelihood estimation of reliability for the products are being produced by two lines under the same facility based on multiply type-II joint censoring scheme
Summary
Different censoring schemes are available in the literature to optimize time, cost and efficiency of the life testing experiment. Type-I and type-II are the two most popular censoring schemes. In a type-I censoring scheme, the experiment is terminated at a prefixed time point. In type-I censoring, number of failures is purely random. It may happened that the observed number of failures during the pre-determined fixed time may be very small or sometimes zero which will lead to a biased or inefficient statistical analysis of associated model parameters. To get a certain number of failures, type-II censoring scheme is used. In type-II censoring scheme, the test termination time is random and it may takes more than the expectation of the experimenter, which increases the cost of the experiment. The work done under such types of censoring schemes is mostly on the basis of single censored sample
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