Abstract
A procedure based on the kinematical theory has been developed to estimate and correct the effects of simultaneous reflections on intensity data collected with the four-circle single crystal X-ray diffractometer through minimizing the scatter of the corrected structure factor (intensity) values of equivalent reflections.
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callDisclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
