Abstract

We present sub-aperture scanning Fourier transform system, a method for fast Bidirectional reflection distribution function (BRDF) measurements. A single lens is used for Fourier transform, and the scattering light field is measured by sub aperture scanning of the Fourier transform lens. Through Fourier transform, a single measurement can obtain multi-angle scattering data, and sub-aperture scanning further expands the measurement angle range. Due to the full utilization of image detectors, once measurement can get 1944 points’ data inside 10°. Thus the system’s precision can get to 0.005°and the measurement time can shorten ten times. Finally, the method is verified by comparing the experimental data. Experimental results show that the relative error of this method is less than 1%. These results provide theoretical basis and technical support for the application of BRDF in sub aperture scanning Fourier transform system.

Talk to us

Join us for a 30 min session where you can share your feedback and ask us any queries you have

Schedule a call

Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.