Abstract
The residual radicals formed in plasma-polymerized styrene (PPS) thin films are investigated by ESR measurement. An asymmetric singlet line characteristic of oxide radicals with an-isotropic g-values (g1=2.008, g2=2.006, and g3=1.993) is observed in PPS produced under oxygen carrier gas, whereas a symmetric line is observed in PPS produced under nitrogen carrier gas, as previously reported. Castner's and Korb and Maruani's methods are used to extract the unresolved inhomogeneous and homogeneous broadenings ΔHG and ΔHL, from which the spin-relaxation times T1 and T2 are obtained. In the case of the PPS with nitrogen carriers, the introduction of air accelerates the decrease in the concentration of radical ions and ΔHG, while it keeps ΔHL constant. The opposite variations in T1 and T2 mean that no annealing effect appear explicitly up to 100°C. At temperatures higher than 100°C, the increase in T2 due to the decrease in the concentration of radicals makes the experimentally-recorded linewidth ΔHmsl narrower.
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