Abstract
An integrated circuit's (IC‘s) susceptibility to fast pulse disturbances, such as electrostatic discharge (ESD), increases significantly if its structural dimensions, operating voltages, and operating thresholds are reduced. This can lead to functional faults in subsequent system-level tests. The technical parameters given in recent datasheets provide little insight in this issue. The given ESD ratings usually apply only to device handling during the manufacturing process. ESD pulse voltage ratings at which functional faults occur are not specified.
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