Abstract
Electron spectroscopy for chemical analysis (ESCA) has been used to study the chemical composition of the passive film which forms on electroplated Sn–Ni alloy. Analysis of the electron binding energy of the tin, nickel, and oxygen lines at various points within the passive film and a depth profile using the structure of (integrated intensities) the Sn 3d5/2 line at 486.5 eV and the O 1s line at 530 eV shows that the passive layer consists of a hydrated surface layer (Sn+4, OH−, O−2, and Ni+2) followed by a SnO2-rich region. The film may also contain some NiO. In the immediate surface region of the passive film, a mixture of stannic oxide, stannic hydroxide, nickel hydroxide, and carbon is observed. The passive film has an overall thickness of ∠30 Å as measured using a quartz crystal oscillator as a mass (thickness) monitor during argon ion sputtering.
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