Abstract
Phase shifting profilometry (PSP) has the advantages of high accuracy, spatial resolution, and anti-noise ability. However, in addition to random noise, indirect illumination, such as subsurface scattering, inter-reflection, and volume scattering, often occurs in the actual measurement environment, seriously affecting the system accuracy. In this paper, a sine series model (SSM) is proposed to simulate the error, which significantly simplifies the computational work. Based on the sine series model, a two-phase correction method (TPC) is proposed, where two phases with different frequencies are adopted to suppress the interference caused by indirect illumination and random noise. Moreover, by combining the multi-wavelength method to unwrap phase, TPC does not need to project additional patterns. Contrast experiments demonstrate that the proposed TPC method has the performance of reducing the error by 40.8%.
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