Abstract
This paper describes a methodology based on dependency graphs for doing concurrent run-time error detection in systolic arrays and wavefront processors. It combines the projection method of deriving systolic arrays from dependency graphs with the idea of input-triggered testing. We call the method ITRED, forInput-driven Time-Redundancy Error Detection. Tests are triggered by inserting special symbols in the input, and so the approach gives the user flexibility in trading off throughput for error coverage. Correctness of timing is proved at the dependency graph level. The method requires no extraPEs and little extra hardware. We propose several variations of the general approach and derive corresponding constraints on the modified dependency graphs that guarantee correctness. One variation performs run-time error correction using majority voting. Examples are given, including a dynamic programming algorithm, convolution, and matrix multiplication.
Sign-in/Register to access full text options 
Talk to us
Join us for a 30 min session where you can share your feedback and ask us any queries you have
Schedule a callMore From: Journal of VLSI signal processing systems for signal, image and video technology
Disclaimer: All third-party content on this website/platform is and will remain the property of their respective owners and is provided on "as is" basis without any warranties, express or implied. Use of third-party content does not indicate any affiliation, sponsorship with or endorsement by them. Any references to third-party content is to identify the corresponding services and shall be considered fair use under The CopyrightLaw.
