Erratum to: “Comprehensive study of the growth of thin oxide layers on Pt electrodes under well-defined temperature, potential, and time conditions” [Journal of Electroanalytical Chemistry, 589 (2006) 120–127

Abstract

In our recent paper [1], we reported on the influence of temperature (T), polarization potential (Ep), and polarization time (tp) on the growth of surface oxides on Pt electrodes. In the course of the data analysis, the real surface area (Ar) of the Pt electrode was calculated from the charge of adsorption and desorption of HUPD (hydrogen under-potential deposition) [2]. However, we made a mistake in determining Ar that was not noticed by us or by the reviewers (this is not meant to sound like a criticism of the reviewers). Yet, our mistake was spotted by Varela and Tremiliosi-Filho who communicated their observation to us and related our data to a recent paper by Sitta and Varela [3]. Consequently, we decided to write a joint ‘‘Erratum”, instead of having a ‘‘Comment” on our paper written by Varela and Tremiliosi-Filho and a subsequent ‘‘Reply” written by us. The correct value of Ar is 1.09 cm and the respective value of the surface roughness factor (R = Ar/Ageom) is 1.85. The change of Ar modifies the values of the current density (i) and the oxide charge density (qox). All the CV profiles, current density and charge density values refer to the real surface area of the electrode (Ar = Ageom R). In Fig. 1, we show the corrected CV oxide-reduction profiles for the Pt oxide formed in 0.5 M aqueous H2SO4 recorded at different polarization potentials, namely 1.10 6 Ep 6 1.50 V with an interval of 0.1 V, while the other parameters were constant, tp = 10 s and T = 293 K. The corrected values of qox are in the 340–694 lC cm 2 range. In Fig. 2, we show the corrected series of CV oxide-reduction profiles for the Pt oxide formed in 0.5 M aqueous H2SO4 at different tp values ranging from 10 to 10 s while the other parameters were constant, Ep = 1.40 V and at T = 293 K. In the inset in Fig. 2, we show a plot of qox vs. log tp; the data indicate that an increase of tp raises qox from 516 to 636 lC cm . In Fig. 3, we present the corrected series of CV oxide-reduction profiles for the Pt oxides formed in 0.5 M aqueous H2SO4 at different T values from 278 to 323 K at Ep = 1.40 V and tp = 10 s. We observe that an increase of T results in an increase of qox from 519 to 655 lC cm 2 (see the inset in Fig. 3), thus some