Errata

Abstract

An error occurred in two articles in Applied Spectroscopy, in “Evaporation and Condensation of SiO and SiO2 studied by Infrared Spectroscopy”, by M. Klevenz, S. Wetzel, M. Moller, and A. Pucci [Applied Spectroscopy, vol. 64, issue 3, pp. 298-303 (2010)], and in “The Temperature Dependent Decomposition of SiO Studied by Infrared Vibrational Spectroscopy” by S. Wetzel, M. Klevenz, A. Pucci, and H.-P. Gail [Applied Spectroscopy, vol. 66, issue 9, pp. 1061-1066 (2012)]. In both the articles, the formula given for the Brendel dielectric function is not consistent with the oscillator parameters of the tables. The correct equation is [Formula: see text] (valid for ε = Re ε + i Im ε). It describes the Brendel dielectric function in accordance to the published values of oscillator parameters. DOI: 10.1366/13-07082 The authors of the paper entitled “Integration of an Intensified Charge-Coupled Device (ICCD) Camera for Accurate Spectroscopic Measurements” published in Applied Spectroscopy, Vol. 66, issue 8, pp. 970-978, (2012), by R.J. Paláez, S. Mar, J.A. Aparicio, and M.T. Belmonte, wish to correct a significant mistake in their published paper. On page 973, the last phrase of the left column should say: “Dotted lines correspond to the fit of the experimental data to the theoretical curve when the detector is the very frequently employed OMAIII EG&G model 1455R 512HQ, while continuous lines correspond to the fit when the measurements are obtained with the newer ICCD.” DOI: 10.1366/13-07083