Erbium YAG laser and diode laser applications for the second phase of implant surgery: a comparison of clinical outcomes

Abstract

This study assessed the clinic outcomes of erbium: yttrium/aluminum/garnet (Er:YAG) laser and diode laser use in second phase of implant surgery. Fifty implants scheduled for stage II implant surgery were randomly assigned to 4 groups. In the first group (G1), Lite-touch Er:YAG laser was selected, and a vacuum-formed template was used for each site to indicate surgical entrance. For the second group (G2), Lite-touch Er:YAG laser was used and the surgery was performed in a free-hand way. The third group (G3) adopted free-hand surgery while diode laser was used. In the last group (G4), LightWalker Er:YAG laser was applied by free hand. The surgeon was allowed to look at cross-sectional images and 3D reconstruction in the computer to obtain implant position in G2, G3, and G4. The time of operation, healing time, and accuracy of operation were assessed. G1 and G4 took the shortest time in surgery than that of the other two groups (P 0.05). The healing time of Lite-touch Er:YAG laser with or without surgical guide was the shortest when compared with the other two groups (P < 0.05). G3 had the longest healing time among the 4 treatment modalities (P < 0.05). When applied in the implant uncover surgery, Er:YAG laser presents shorter healing time than diode laser. Contact laser operation provides more accuracy than noncontact operation.