Er 3 + diffusion in congruent LiNbO3 crystal doped with 4.5 mol % MgO

Abstract

Standard thermal diffusion of Er3+ into X-cut congruent LiNbO3 crystal with the MgO doping level close to the antiphotorefractive threshold concentration, 4.5 mol%, was attempted at the temperature close to Curie point of the crystal. Single-crystal x-ray diffraction, photoluminescence spectroscopy and secondary ion mass spectrometry (SIMS) were used to study the crystalline phase with respect to Er3+ ions and the depth profile of the diffused Er3+ ions. The results show that the thickness of the Er metal film coating should not be thicker than 4.6 nm. In this case, the diffusion is complete, the diffused surface is clean, and the Er3+ ions in the diffused layer still retain the LiNbO3 phase. On the other hand, the diffusion will be incomplete if the initial thickness of the Er metal film is thicker than 4.6 nm. The residual Er3+ ions form ErNbO4 grains on the surface of the crystal. SIMS analysis shows that the diffused Er3+ ions follow a monoexponential decay profile. The experimental results also show that the diffusivity of Er3+ in the X-cut congruent Mg(4.5 mol %):LiNbO3 is similar to 4.69×10−3 μm2/h at 1130 °C. Further vapor transport equilibration treatment following the standard diffusion procedure results in transformation of the diffused Er3+ ions from LiNbO3 into the ErNbO4 phase and, hence, substantial spectral change of the 1.5 μm emission.