Equivalent width of copper and potassium resonance lines at 3247.54, [formula omitted] for Voigt profile by atomic absorption measurements

Abstract

A simple reliable theoretical approach is developed to calculate the equivalent width of copper and potassium resonance lines at 3247.54 and 7665 A ̊ using atomic absorption techniques. The calculations have been carried out for the two limiting cases of a pure Doppler (Gaussian) and Lorentzian (dispersion) line profiles. The more general case of a Voigt line profile leads to an efficient analytical formula permits a rapid estimate of the equivalent width with sufficient precision. The reliability of the approach has been verified by providing the curves of growth for the given spectral lines to describe the behavior of the equivalent width as the number of absorbing atoms in the ground state is increased. Allowance is made in the analysis for the dependence of the equivalent width for Voigt profile on the damping constant α, which is a measure of the half width of Lorentz profile relative to the Doppler profile.