Equivalence of physical optics and aperture field integration method in the full pattern analysis-effects of integration surface

Abstract

The integration surface and the equivalent currents in aperture field integration method (AFIM) are numerically discussed in view of the equivalence of physical optics (PO) and AFIM. It was shown that provided we account for the lateral surface besides the projected aperture and we use the equivalent currents consisting of both the incident and geometrical optics (GO) reflected fields, PO and AFIM predict the equivalent-patterns in all the angular region. The roles of the incident and GO reflected fields in the definition of the equivalent currents are extracted.