Abstract
Low-temperature scanning electron microscopy (LTSEM) and low-temperature scanning laser microscopy (LTSLM) are both methods for analyzing local electrical properties of superconducting devices. With both techniques we have investigated a YBa 2Cu 3O 7 (YBCO) multi-layer device on a SrTiO 3 (100) substrate namely a micro-bridge containing a set of crossovers. We find that critical current density and critical temperature of this device are reduced at the edges of the crossovers. Complete equivalence of the results obtained for LTSEM and LTSLM has been found, in particular concerning the spatial distribution, the temperature dependence, and the strength of the signal.
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